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NTUCHE

All laboratories are equipped with specialized instruments for their own research fields. In addition, the Department consolidates the relevant equipment in two centralized laboratories: the Instrumental Analysis Laboratory and the Particulate Technology Laboratory. These two laboratories provide services to all our faculty members and students for their research and/or teaching needs. For the purpose of education and research in particulate techniques, the Particulate Technology Laboratory also offers related courses every semester, and some symposiums and seminars are hosted regularly or irregularly. The Particulate Technology Laboratory also accepts industrial membership to coordinate the industry with the academics and to get support from these enterprises.

Particulate Technology Laboratory

The laboratory is equipped with the most complete set of devices for measurements of various properties of particulates and nanomaterials, including particle size distribution, specific volume, porosity, zeta-potential, particulate density, and transport properties. The lab is managed by professional technicians and provides services such as technical training, consulting, and sample analysis.

Instrumental Analysis Laboratory

This laboratory consolidates relevant equipment for thermal analysis, chemical analysis, material characterization and analysis, and fluid properties analysis. Thermal Analysis: Thermogravimetric Analysis (TGA), Differential Scanning Calorimetry (DSC), TD-DTA-DSC-Mass Spectroscopy, Dynamic Mechanical Analysis (DMA); Chemical Analysis: UV- Visible Spectrophotometer, Atomic Analyzer (AA), Gas Chromatography (GC), High-Performance Liquid Chromatography(HPLC), Gel Permeation Chromatography (GPC), Ion Chromatography (IC), Ultra Centrifuge; Materials Characterization and Analysis :Scanning Electron Microscopy (SEM), Energy- Dispersive X-Ray Spectroscopy(EDS), Fourier-Transform Infrared Spectroscopy(FTIR), Polarized Optical Microscopy, Optical Microscopy, X-Ray Diffractometry (XRD), X-Ray Fluoresence Film-Thickness Analyzer, Ellipsometer, Electrospectroscopy for Chemical Analysis (XPS), Atomic Force Microscopy (AFM); Fluid Properties Analysis: Viscometer, Laser Doppler Anemometer, Rheometer, Surface Tensiometer.Furthermore, software such as Aspen Plus, ChemCad, Fluent, and FIDAP are used for teaching and research purposes.

X-ray diffractometer
This device allows for determination of the crystallographic structure of powders, thin-films, and analysis of residual stress. With a maximum voltage 60kV and maximum current of 50mA, the X-ray diffractometer can provide small angle diffraction data with temperature control.

Scanning Electron Microscope (SEM) and Energy Dispersive Spectrometer

SEM provides the image (up to 100000 magnification) of surfaces and three dimensional structures of biological or nonbiological samples.

EDS provides qualitative and semi-quantitative information on the chemical composition in microstructures. It also provides the full energy spectrum, mapping and line profile for molecules whose atom number is greater than 5.

Other public facilities

Electron Spectroscopy for Chemical Analysis (ESCA):

The ESCA provides quantitative information on the chemical composition of surfaces or thin films. This machine is equipped with a high energy X-ray source ( Al Kα(1486.6eV) or Mg Kα(1253.6eV) ) and 9 detectors in the CLAM4MCD electron Analyzer.

Unit Operation Laboratory

The experimental setups in this lab provide students the opportunity to practice the chemical engineering principles learned in class. The figure shows a fully automated and computerized boiling device, allowing the students to observe the boiling phenomena and understand its mechanism.

Computer Classroom

The PC classroom provides CHE members a convenient environment for study, teaching, and research. .

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